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GLASS AND SOLAR

Process Control for (coated) Glass and Thin Film PV
based on dr.schwab's spectrometric Full Surface Coating Analysis plus Camera Inspection

For Architectural Glass as well as for Thin Film Photovoltaics (e.g. CIS/CIGS), big glass sheets are coated with multiple, very thin layers. For both, dr.schwab not only offers camera inspection, but also spectrometer-based process control solutions, revealing thickness deviations at full sample surface.

For thickness analysis of very complex layer stacks, dr.schwab developed its Multi Station Layer Thickness Analysis, where thickness is measured in-situ after several coating stations, with calculation including the results of all preceding stations.

For Thin Film PV, full surface Haze analysis is offered additionally.

The comprehensive process and quality control is completed by dr.schwab's powerful data analysis tools, which not only allow to correlate measurement results with a line's yield but even includes process parameter variations.

Details and brochure downloads see 'Products' -> 'SOLAR' -> 'FPI-solar'
and 'Products' -> 'Functional Coatings (Foil, Glass)'


Events
Upcoming Show
SNEC PV Power Expo 2013, Shanghai
At this years show on May 14 – 16, 2013, dr.schwab will be represented by its Chinese Agent NOVTEC GROUP at booth E3-375.
more-»
News
Product Update
New IQPC blu inline scanners for BD recordable
Intermediate scanner for LTH manufacturing
more-»
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Press Contact:
Franz Rieger
Marketing
Phone: +49 8251 9008-14
Fax: +49 8251 81194