GLASS AND SOLAR
Process Control for (coated) Glass and Thin Film PV
based on dr.schwab's spectrometric Full Surface Coating Analysis plus Camera Inspection
For Architectural Glass as well as for Thin Film Photovoltaics (e.g. CIS/CIGS), big glass sheets are coated with multiple, very thin layers. For both, dr.schwab not only offers camera inspection, but also spectrometer-based process control solutions, revealing thickness deviations at full sample surface.
For thickness analysis of very complex layer stacks, dr.schwab developed its Multi Station Layer Thickness Analysis, where thickness is measured in-situ after several coating stations, with calculation including the results of all preceding stations.
For Thin Film PV, full surface Haze analysis is offered additionally.
The comprehensive process and quality control is completed by dr.schwab's powerful data analysis tools, which not only allow to correlate measurement results with a line's yield but even includes process parameter variations.
Details and brochure downloads see 'Products' -> 'SOLAR' -> 'FPI-solar'
and 'Products' -> 'Functional Coatings (Foil, Glass)'